Ann T. TAI
IA Tech, Inc.
Senior Scientist
Addr: 5746 Kiyot Way, Playa Vista, CA 90094
Tel: (310) 745-1861
Email: tai@ia-tech.com,
a.t.tai@ieee.org
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Ann T. TAI
IA Tech, Inc.
Addr: 5746 Kiyot Way, Playa Vista, CA 90094 |
Dr. Ann T. Tai is a Sr. Scientist of IA Tech, Inc., Los Angeles, California. She has been active in dependable systems and networks research for over 15 years. Her doctoral and post-doctoral research focused on performability modeling and applications, resulting in a book Software Performability: From Concepts to Applications (Kluwer Academic Publishers, 1996). She has over 60 publications in the areas of performability modeling applications, fault-tolerant architectures, distributed computing, and dependability in wireless ad hoc networks.
Prior to co-founding IA Tech, she worked for SoHaR Incorporated where she participated research projects funded by the Air Force, Nuclear Regulatory Commission, and Federal Aviation Administration. She was an Assistant Professor at the University of Texas at Dallas during 1993 and was the Principle Investigator of a National Science Foundation project ``Adaptive Performability Management.''
Her current research interests concern the design, development, and evaluation of dependable systems and networks, error containment and recovery algorithms for distributed embedded computing, distributed fault-tolerant system architectures, and robust data-communication protocols for wireless ad hoc networks. She is a member of the IEEE. She has been active in serving the IEEE Computer Society in various capacities. She has served on program and/or organization committees for a number of IEEE international conferences, including the IEEE International Performance and Dependability Symposium (one of the two main tracks of the International Conference on Dependable Systems and Networks, DSN), International Symposium on Fault-Tolerant Computing (FTCS), Pacific Rim International Symposium on Dependable Computing (PRDC), International Symposium on Reliable Distributed Systems (SRDS), and the IEEE High-Assurance Systems Engineering Symposium (HASE).
